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X-Parameters: A new Paradigm for Interoperable Measurement, Modeling, and Simulation of Nonlinear Microwave and RF Components
David Root

Citation
David Root. " X-Parameters: A new Paradigm for Interoperable Measurement, Modeling, and Simulation of Nonlinear Microwave and RF Components". Agilent Technologies, April, 17, 2009.

Abstract
(No abstract.)

Electronic downloads

Citation formats  

  • HTML
    David  Root. <a
    href="http://bwrc.eecs.berkeley.edu/php/pubs/pubs.php/1130.html"><i>
    	  X-Parameters: A new Paradigm for Interoperable
    Measurement, Modeling, and Simulation of Nonlinear Microwave
    and RF Components</i></a>, Agilent Technologies,
    April, 17, 2009.
  • Plain text
    David  Root. " 	  X-Parameters: A new Paradigm for
    Interoperable Measurement, Modeling, and Simulation of
    Nonlinear Microwave and RF Components". Agilent
    Technologies, April, 17, 2009.
  • BibTeX
    @seminar{Root2009,
        author = {David  Root},
        title = { 	  X-Parameters: A new Paradigm for Interoperable
                  Measurement, Modeling, and Simulation of Nonlinear
                  Microwave and RF Components},
        organization = {Agilent Technologies},
        month = {April},
        day = {17},
        year = {2009},
        URL = {http:///php/pubs/pubs.php/1130.html}
    }
    

Posted by Olivia Nolan on Sep 15, 2009..

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