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Measurement and analysis of variability in 45nm strained-Si CMOS technology
Liang-Teck Pang, Kun Qian, Costas Spanos, Borivoje Nikolic

Citation
Liang-Teck Pang, Kun Qian, Costas Spanos, Borivoje Nikolic. "Measurement and analysis of variability in 45nm strained-Si CMOS technology". IEEE Journal of Solid-State Circuits, 44(9), September 2009.

Abstract
A test-chip in a low-power 45nm technology, featuring uniaxial strained-Si, has been built to study variability in CMOS circuits. Systematic layout-induced variation, die-to-die (D2D), wafer-to-wafer (W2W) and within-die (WID) variability has been measured over multiple wafers, analyzed and attributed to likely causes in the manufacturing process. Delay is characterized using an array of ring oscillators and transistor leakage current is measured with an on-chip ADC. The key results link systematic layout-dependent and die-to-die variability as being caused by gate patterning and material strain. In comparison to a previous 90nm experiment, gate proximity now contributes less to frequency variability, causing a 2% change in overall performance, while strain has increased its contribution to about 5% of the overall performance.

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Citation formats  

  • HTML
    Liang-Teck Pang, Kun Qian, Costas Spanos, Borivoje Nikolic.
    <a
    href="http://bwrc.eecs.berkeley.edu/php/pubs/pubs.php/970.html">Measurement
    and analysis of variability in 45nm strained-Si CMOS
    technology</a>, <i>IEEE Journal of Solid-State
    Circuits</i>, 44(9), September 2009.
  • Plain text
    Liang-Teck Pang, Kun Qian, Costas Spanos, Borivoje Nikolic.
    "Measurement and analysis of variability in 45nm strained-Si
    CMOS technology". IEEE Journal of Solid-State
    Circuits, 44(9), September 2009.
  • BibTeX
    @article{PangQianSpanosNikolic2009,
        author = {Liang-Teck Pang and Kun Qian and Costas Spanos and
                  Borivoje Nikolic},
        title = {Measurement and analysis of variability in 45nm
                  strained-Si CMOS technology},
        journal = {IEEE Journal of Solid-State Circuits},
        volume = {44},
        number = {9},
        month = {September},
        year = {2009},
        URL = {http:///php/pubs/pubs.php/970.html}
    }
    

Posted by Borivoje Nikolic on Apr 15, 2009..

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